X-ray powder diffraction (XRD) is a fundamental, non-destructive technique for analyzing the structure of materials, enabling the precise identification and quantification of crystalline phases, determination of crystallite size and microstrain, analysis of thin films, nanostructures, and textural properties. The method supports a wide range of applications—from routine quality control to advanced research on functional materials, battery components, and thin-film systems.
Our laboratory is equipped with the Empyrean Series 3 diffractometer (Malvern Panalytical), a highly flexible, modular multi-geometry XRD platform. The system supports reflection and transmission geometries, grazing-incidence measurements, SAXS/VSAXS, and X-ray reflectivity. Thanks to its modular optical architecture, rapid component exchange, and fully motorized sample positioning, the instrument offers exceptional adaptability for both standard and highly specialized experiments.
Key features
- Multi-geometry XRD platform
Support for reflection, transmission, grazing-incidence, SAXS, and reflectivity modes for comprehensive structural characterization. - High-precision sample positioning
Motorized XYZ translation (10–10–10 mm) with rotation/tilt capabilities and micro-beam analysis down to <300 × 300 µm for localized studies. - Atmosphere-controlled measurements
Capability to operate in air, vacuum, nitrogen, and a broad range of reactive gases, including H₂, CH₄, CO, and other reducing or oxidizing atmospheres. - Operando capability for energy materials
Dedicated holders for coin-cell batteries and an electrochemical cell for structural monitoring during charge–discharge cycling.
X-ray Photoelectron Spectroscopy (XPS) is a non-destructive analytical technique used to determine the elemental composition and chemical states of material surfaces. By probing only the topmost atomic layers, XPS provides highly surface-sensitive information, enabling the accurate quantification of surface chemistry and a detailed analysis of chemical bonding environments. This makes the technique indispensable for advanced materials research and surface characterization.
Our laboratory is equipped with a Thermo Scientific Nexsa G2 XPS system, featuring a monochromated, micro-focused Al Kα X-ray source (1486.6 eV). The instrument supports ion-beam etching for depth profiling and UPS measurements. It offers an adjustable X-ray spot size ranging from 10 to 400 µm, enabling the analysis of both small, localized features and larger heterogeneous areas. The system accommodates samples up to 20 mm in thickness.
Key features
- Automated multi-technique XPS platform
Fully automated system integrating vacuum control, acquisition, and data processing for streamlined surface analysis. - Monochromated micro-focused Al Kα source
High-stability X-ray source with adjustable spot size from 10 to 400 μm for precise analysis of small or heterogeneous areas. - High-resolution hemispherical analyzer
180° analyzer providing excellent energy resolution (<0.50 eV) for reliable chemical state identification. - Integrated ion source for depth profiling
Ion gun enabling controlled sputtering and depth-resolved chemical analysis.
